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    NSI-OP-5929
 XYZ Optical Measurement System

DESCRIPTION

For high accuracy measurements, the NSI-OP-5929 Optical Measurement System (NSI Patent No.5,408,318) can be added to a large vertical or horizontal scanner to improve the probe position accuracy. This optional measurement system dynamically tracks probe X and Y positions in real time. The system also permits automated generation of probe X, Y and Z calibration error tables. The system uses laser interferometers for the X and Y position feedback, and a patented NSI optical subsystem for measuring the probe’s straightness.

CAPABILITIES

The system uses laser interferometers for the X and Y position feedback, and a patented NSI optical subsystem for measuring the probe’s straightness. The NSI Antenna Measurement Software with built-in monitoring and calibration routines controls the optical system. The system includes NSI’s active position correction software, which uses the measured errors to actively move to a corrected position on the fly while acquiring near-field data (NSI Patent No. 5,419,631). The system consists of a NSI-OP-5930 Z-Laser, NSI-OP-5904 Z-Sensor, NSI-OP-5906A XY Optics Assembly , laser interferometers, and software.

FEATURES
  • NSI patented technique
  • Triggered data acquisition at the position from the laser to improve measurement accuracy
  • Good for large size planar scanners and high frequency measurements
  • Suitable for vertical or horizontal planar scanners
  • Includes NSI-OP-5928 XY Measurement System and NSI-OP-5908 Z-Plane Laser Subsystem

SPECIFICATIONS
See NSI-OP-5928 for XY-subsystem specifications
See NSI-OP-5908 for Z-subsystem specifications

DIMENSIONS

ORDERING INFORMATION

Please contact the NSI Sales department to order this system.

Nearfield Systems, Incorporated
19730 Magellan Drive, Torrance, CA 90502, USA, Tel: 310.525.7000, Fax: 310.525.7100
Email: sales@nearfield.com. Visit our website: www.nearfield.com